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Ultimo aggiornamento 2018-02-13
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on connaít des propositions qui procèdent par simulation du fonctionnement global du circuit à tester, à partir d'une description préalable complète de ce circuit: ep-a-0 231 948, nachrichtentechnik elektronik, vol. 32, n° 11, 1982,pp. 460, 465-467, et l'article de deves et al, "dedale: an expert system for troubleshooting analogue circuits", international test conference 1987, ieee catalog no 87ch2437-2, p. 586-594.
the article by deves et al, "dedale: an expert system for troubleshooting analogue circuits" international test conference 1987, ieee catalogue no. 87ch2437-2, pp. 586-594 describes an expert system capable of testing an electronic circuit.
Ultimo aggiornamento 2014-12-03
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